The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2000

Filed:

Jun. 02, 1998
Applicant:
Inventors:

Michael Willsch, Furth, DE;

Thomas Bosselmann, Erlangen, DE;

Stefan Hain, Effeltrich, DE;

Assignee:

Siemens AG, Munich, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 96 ; 3241 / ; 3242441 ; 250225 ;

Find Patent Forward Citations

Willsch, Michael. (2000). Optical measuring method and optical measuring device for measuring an (U.S. Patent No. 6154022). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6154022

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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