The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2000

Filed:

Sep. 30, 1999
Applicant:
Inventors:

Charles William Russ, IV, Sunnyvale, CA (US);

Jerry T Dowell, Portola Valley, CA (US);

Steven M Fischer, Hayward, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250292 ;
Abstract

A mass spectrometer method and apparatus improve resolution and sensitivity. A voltage supply is coupled to a mass filter for applying a radio frequency voltage and for operating at at least one selected frequency. An ion optical element such as an entrance lens is driven by a voltage supply that is phase coherent with the voltage applied to the mass filter. The ion beam is tailored so that the phase space relationship of the ions is more closely matched to the acceptance of the mass filter. The ions in the incoming beam are dynamically matched to the acceptance of the mass filter over each cycle of the voltage applied to the mass filter. The ion optical element may be a single entrance lens to which is applied only a single phase coherent voltage.


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