The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2000
Filed:
Jul. 14, 1998
Michael A Miller, San Antonio, TX (US);
Stephen J Hudak, Jr, San Antonio, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
EIS and EMIS methods of assessing the fatigue status of a material. The EIS method uses an electrochemical transducer cell to apply electrical perturbations to the material, and to acquire voltage and current measurements over a range of frequencies. The impedance at each frequency is calculated, resulting in impedance spectrum data. This data is correlated to reference data representing the fatigue life of the material. The EMIS method is similar except that mechanical instead of electrical perturbations are applied to the material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile