The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2000
Filed:
Jan. 27, 1999
Lee Grodzins, Lexington, MA (US);
Roderick D Swift, Belmont, MA (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
An inspection system for inspecting an enclosure and its contents using temporally gated sources of penetrating radiation. A first source produces an intermittent first beam having a duration of inactivity while a second sources produces a second beam, which may have an energy spectrum differing from that of the first beam, during the inactivity of the first beam. One detector generates a transmission signal based on penetrating radiation transmitted through the enclosure while a scatter detector generates a scatter signal based on penetrating radiation scattered by the contents of the enclosure. The scatter detector may be gated for non-detection during the pulsing of the transmission beam. A processor derives properties of the contents of the enclosure on the basis of the transmission signal and the scatter signal.