The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2000
Filed:
Nov. 18, 1997
Minolta Co., Ltd, Osaka, JP;
Abstract
A three-dimensional measuring system comprises an optical system for emitting a light and optically scanning an object, a measuring sensor having an image pickup surface consisting of a plurality of picture elements and adapted to receive the light reflected on the surface of the object, a galvanometer mirror for changing a direction in which the light irradiates the object, a system controller for driving the measuring sensor so as to allow the same to output information on the quantity of light incident on each of the picture elements, and a barycentric calculation circuit for finding an instant when the light traverses each of the picture elements. This instant is found by implementing a barycentric calculation on the basis of outputs of the measuring sensor taken for a prescribed period of time and an instant at which each of the outputs is taken. The measuring system further comprises a host computer for finding a position on the surface of the object corresponding to each of the picture elements. This position is found on the basis of a relationship between a direction in which the light irradiates the object at an instant when the light traverses each of the picture elements and a direction in which the light reflected on the surface of the object is incident on each of the picture elements.