Lcd panel power-up test fixture and method of using

Abstract

An adjustable LCD panel power-up test fixture and a method for using the fixture are disclosed. In a preferred embodiment, an adjustable test fixture is constructed by mounting removable side frames onto a substantially planar base plate with conductive elements provided on the top surfaces of the side frames. The side frames are arranged and mounted in such a way that one side frame slidingly engages another for fixing a pre-selected length of the side frame necessary for testing the LCD panel. In an alternate embodiment, the base plate is not used where four side frames slidingly engaging each other to form an adjustable test frame. The four side frames are each provided with a horizontal portion and a vertical portion. The vertical portions of the four side frames are of substantially the same height, while the horizontal portions are provided with a recessed slot for engaging the horizontal portions of the other side frames. Once a suitable size is adjusted, the four side frames may be locked together by using a mechanical locking means prior to the testing of the LCD panel. The adjustable test fixture may further be provided with an upper plate for each horizontal portion of the side frames equipped with flexible tubular sections on a bottom surface of the upper plate such that a suitable pressure may be applied between the conductive leads on the LCD panel and the conductive elements on the PCB provided on the top surfaces of the side frames. The present invention novel apparatus of an adjustable test fixture for LCD panel power-up test allows the testing of any size LCD panels in the same test fixture by suitably adjusting the length of each side frame in the fixture.