The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2000
Filed:
Sep. 18, 1997
Timothy C Tiernan, Santa Fe, NM (US);
Raymond L Jarratt, Jr, Los Lunas, NM (US);
TPL, Inc., Albuquerque, NM (US);
Abstract
An apparatus and method for detecting defects in electrically conductive materials. A detection method and apparatus are provided for using applied magnetic fields to induce magnetic fields in the material under test, and then directly detecting changes in the induced magnetic field attributable to corrosion, cracks, flaws, or anomalies in the material under test. The invention features the use of one or more giant magnetoresistance sensors to detect directly the changes in the induced magnetic field, which changes provoke a response in the giant magnetoresistance sensors in the form of a change in resistance signal. The apparatus may be configured in various ways, including absolute field detection and differential field detection configurations, with either passive or active field compensation, and single sensor or multiple sensor arrays. A plurality of giant magnetoresistance sensors may be disposed upon a single substrate, or on multiple substrates. The invention includes method for performing detection by use of giant magnetoresistance.