The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2000
Filed:
Mar. 04, 1999
Applicant:
Inventor:
Chin Chun Chou, Taiping, TW;
Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G / ; G01G / ;
U.S. Cl.
CPC ...
177145 ; 177245 ;
Abstract
A testing device includes a housing having a number of openings formed in a partition for receiving a number of cups. The housing includes an x-axis track, a y-axis track and a z-axis track. A scale is moved along the x-axis track and the y-axis track of the housing to a position below the cups and is elevated to move the cups upward and to measure the changes of the weight of the cups in a suitable time interval. The cups may receive the desiccating agent, water or the plants whose weight are required to be measured frequently.
Chou, Chin. (2000). Automatic testing device (U.S. Patent No. 6150618). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6150618
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile