The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2000

Filed:

Apr. 25, 1997
Applicant:
Inventors:

Timothy Edward Boles, Tyngsboro, MA (US);

Joel Lee Goodrich, Westford, MA (US);

Assignee:

The Whitaker Corp., Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438128 ; 438D / ; 438D / ; 438D / ;
Abstract

A process for fabricating heterolithic microwave integrated circuits. According to one exemplary embodiment, a glass substrate is fused to a silicon wafer, and the silicon wafer is etched to effect silicon pedestals. A glass layer is fused onto and about the silicon mesas and effectively polished to expose the tops of the silicon mesas. The backside glass layer is then polished to render a final thickness of the dielectric layer between the top surface and ground plane. In another exemplary embodiment, a layer of silicon may be selectively etched to form mesas that function as either pedestals or vias. A layer of glass may be fused to the silicon prior to etching. A layer of glass is fused to the silicon substrate and pedestals and planarized through standard polishing techniques. The wafer may be 'flipped over' and polished in order to remove a substantial portion of the silicon or glass, depending on which is used. Thereafter, the integrated circuit is fabricated through standard techniques.


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