The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2000

Filed:

Feb. 13, 1998
Applicant:
Inventors:

Yves Painchaud, Sainte-Marie, CA;

Michel Morin, Cap-Rouge, CA;

Andre Parent, Quebec, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600476 ; 356446 ; 600473 ;
Abstract

A method of optical imaging through a scattering medium is provided in which a fit is made to an inhomogeneous diffusion model. The method facilitates good differentiation between scattering and absorption. The variation of the diffusion curve associated with the presence of an inclusion is considered rather than the diffusion curve itself. An empirical model is provided which describes the variation of the diffusion curve. A linear curve fitting process is performed to provide two parameters, one parameter associated with the scattering property of the inclusion and the other parameter associated with the absorption property of the inclusion.


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