The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2000
Filed:
Aug. 12, 1999
Applicant:
Inventor:
Zheng Jason Geng, Kensinton, MD (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 356-301 ; 356375 ;
Abstract
A three-dimensional (3D) surface profile measurement method and apparatus uses projected energy with a known spatially varying wavelength distribution over the surface of objects in a scene. The varying wavelength of the light corresponds to the angle at which the light is emitted from a light source. Given this correspondence, light reflected from the scene can be identified by wavelength as to angle at which it was emitted. Triangulation can then be used to determine the distance to the point in the scene from which the detected light is reflected. When performed over a number of points on the scene, a three-dimensional profile of the scene can be generated.