The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2000
Filed:
Apr. 01, 1999
Donald G Heflinger, Torrance, CA (US);
Lee O Heflinger, Torrance, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
A dynamic instrument measures the state of optical phase of light and provides an output signal having a magnitude that varies linearly relative to the state of optical phase of a first light beam. It comprises means for generating an optical signal, means for generating a radio frequency (RF) signal that is responsive to the optical signal and the RF signal and provides a first light beam and a second light beam, at least one of which is shifted in frequency by an amount corresponding to the RF, an optical interferometer that allows the state of optical phase of the first beam to be changed and that interferometrically combines and heterodynes the changed first light beam and the second light beam, means responsive to the heterodyne signal and operative to produce an electrical signal at the optical beat frequency corresponding to the RF, and means responsive to the RF signal and the electrical signal for providing the linear output signal.