The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2000
Filed:
May. 08, 1998
Applicant:
Inventors:
Stuart O Nelson, Athens, GA (US);
Samir Trabelsi, Athens, GA (US);
Andrzej W Kraszewski, Athens, GA (US);
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324637 ;
Abstract
A method for simultaneously and independently measuring moisture content and bulk density of particulate materials using radio-frequency measurements allowing for on-line, real-time monitoring and control. Moisture and density are determined by measurements of complex permittivities. This method is based on the use of the dielectric properties of the materials for density and water content determination.
Nelson, Stuart. (2000). Method for the simultaneous and independent determination of moisture (U.S. Patent No. 6147503). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6147503
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile