The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2000
Filed:
May. 17, 1999
Scott T Quarmby, Austin, TX (US);
Richard A Yost, Gainesville, FL (US);
University of Florida, Gainesville, FL (US);
Abstract
The subject invention pertains to a scan function which will allow parent and neutral loss scans, with a reduced number of false positives, greater detection efficiency, shortened time periods, and enhanced mass resolution, to be performed on the quadrupole ion trap mass spectrometer. In a specific embodiment, the subject invention involves first trapping ions of interest and obtaining a mass spectrum of the m/z range of interest. The (m/z)'s which are present and meet certain predetermined criteria can then be selected and stored. Ions are again trapped in the ion trap and then all ions with (m/z)'s below that of the first ion of interest are ejected. The first ion of interest is resonantly excited to cause CID and the presence of a particular daughter ion is then determined using a standard mass-selective instability scan over a narrow m/z range with resonant ejection at a predetermined ejection q.sub.z. The ion trap is then cleared of all ions with (m/z)'s below that of the next ion of interest and the process is repeated.