The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2000
Filed:
Jul. 23, 1998
Applicant:
Inventor:
Michael L Christensen, Windsor, CO (US);
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250234 ; 358497 ;
Abstract
Disclosed herein is a method and apparatus for compensating for temperature-induced scan line drift in a photoelectric imaging apparatus. A scan line drift compensation mechanism may be placed in contact with at least one of the optical components, e.g, a mirror, contained within the optical system of a photoelectric imaging apparatus. The scan line drift compensation mechanism may be formed from two members, each having a different coefficient of thermal expansion. In this manner, the scan line drift compensation mechanism is able to exert a force on the optical component in response to a change in temperature.