The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2000

Filed:

Aug. 25, 1999
Applicant:
Inventors:

Chien-chun Wang, Hsinchu, TW;

Eddie Chiu, Chia-Yi, TW;

Chung-Yi Chen, Yung-Kang, TW;

Hsien-Yuan Chang, Taipei, TW;

Assignees:

ProMOS Tech., Inc., Hsinchu, TW;

Mosel Vitelic, Inc., Hsinchu, TW;

Siemens AG, Muchen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438618 ; 438637 ; 438624 ; 438633 ; 438672 ;
Abstract

A method for forming a contact plug that lands on a metal line of an interconnect structure formed on a semiconductor substrate. First, a first insulating layer is formed atop the substrate and between gaps in the interconnect structure. Next, an etching stop layer is formed on the first insulating layer. A second insulating layer is formed atop the etching stop layer. The second insulating layer is patterned and etched, stopping at the etching stop layer, to form a contact opening. The portion of the etching stop layer left exposed by the contact opening is removed. Finally, a barrier metal layer is formed along the walls of the contact opening and a conducting layer is deposited into the contact opening.


Find Patent Forward Citations

Wang, Chien-chun. (2000). Method for forming a contact plug over an underlying metal line using an (U.S. Patent No. 6146987). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6146987

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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