The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2000
Filed:
Feb. 05, 1998
Applicant:
Inventors:
Jurgen Weese, Henstedt-Ulzburg, DE;
Thorsten Buzug, Hamburg, DE;
Graeme P Penney, London, GB;
David J Hawkes, London, GB;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382132 ; 382278 ;
Abstract
The invention relates to a method of determining the spatial transformation between an object which is three-dimensionally reproduced by a data set and the object itself. According to the method at least one X-ray image of the object is formed. A pseudo-projection image is calculated for a part of the volume represented by the data set, said pseudo-projection image being compared with the X-ray image. The parameters on which the calculation of the pseudo-projection image is based are varied until optimum registration is achieved.