The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2000
Filed:
Jun. 09, 1999
Applicant:
Inventor:
Leslie M Brooks, West Melbourne, FL (US);
Assignee:
ZEN Licensing Group, LLP, Atlanta, GA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324519 ; 324527 ; 324537 ;
Abstract
A method and apparatus for detection of manufacturing defects during in-circuit testing. A preferred embodiment utilizes an onboard controllable signal source and/or an external signal source, in combination with capacitive sensors, to detect defects. In an embodiment of the present invention, prediction equations are implemented to increase both the efficiency and effectiveness of defect detection and location.