The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2000

Filed:

Aug. 18, 1997
Applicant:
Inventors:

Yehuda Sharf, Tel Aviv, IL;

Gil Navon, Ramat Gan, IL;

Uzi Eliav, Ramat Gan, IL;

Liat Tsoref, Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324306 ; 324300 ;
Abstract

A method for depicting the anatomy and quantitative tissue strain of a biological tissue. A spatially resolved, double quantum filtered, nuclear magnetic resonance frequency spectrum is acquired from either .sup.1 H or .sup.2 H nuclei in the tissue. Values in the time domain or frequency domain representations of the free induction decay signal are mapped in 2 spatial dimensions so as to selectively depict histological layers of the tissue anatomy. The residual quadrupolar or dipolar splitting is calculated from the free induction decay signal, and then correlated with a tissue strain value by utilizing a known formula describing the correlation between residual quadrupolar or dipolar splitting and tissue strain. The tissue strain value is then mapped in two spatial dimensions.


Find Patent Forward Citations

Loading…