The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2000
Filed:
Jul. 17, 1998
Naoya Tamaki, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A magnetic measuring apparatus measures, at a high spatial resolution, a magnetic field generated by a current flowing in one of a plurality of highly packed parallel wires on a printed-circuit board. The magnetic measuring apparatus includes a magnetic field detector for detecting a magnetic field generated by a current flowing in one of a plurality of parallel wires, a measuring unit for measuring a magnetic field intensity based on an output signal from the magnetic field detector, an input unit for entering a pitch of the parallel wires and a spatial resolution characteristic of the magnetic field detector, a processor for calculating a height of the magnetic field detector from the one of the parallel wires based on the pitch of the parallel wires and the spatial resolution characteristic, and a scanning device for scanning the magnetic field detector into a position determined by the processor. The height of the magnetic field detector is adjusted such that a location where magnetic fields generated by a current flowing in one of the wires and a mirror-image current symmetrical with respect to a ground surface cancel each other is brought into agreement with the position of an adjacent wire, for thereby suppressing the effect of a magnetic field from the adjacent wire.