The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2000

Filed:

Mar. 26, 1999
Applicant:
Inventors:

Takao Kokubu, Akishima, JP;

Hiroki Kunitake, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ; G01B / ;
U.S. Cl.
CPC ...
2503581 ; 378 61 ;
Abstract

A mark inspecting system comprises a camera (30) held in a predetermined position on a marking device (20) capable of being located close to or in contact with a tire (1) supported on a marking table (3) to form a mark (M) on the tire (1), a photocoupler (36) for detecting the separation of the marking device (20) by a predetermined distance from the tire (1) after the mark (M) has been marked on the tire (1), a controller (35) for operating the camera (30) to form an image of the mark marked on the tire (1) upon the reception of a detection signal provided by the photocoupler (36) upon the detection of the separation of the marking device (20) by the predetermined distance from the tire (1), and an image processing device (31) for analyzing the image of the mark (M) formed by the camera (30) for the inspection of the mark (M).


Find Patent Forward Citations

Loading…