The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2000

Filed:

Aug. 25, 1998
Applicant:
Inventors:

Hui David He, Waukesha, WI (US);

Stanley H Fox, Brookfield, WI (US);

Sholom M Ackelsberg, Brookfield, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378-4 ; 378901 ;
Abstract

A scalable multislice system configured to generate multiple streams of image data with different image quality characteristics prospectively and simultaneously is described. Such capability enables improving existing clinical diagnosis and also enables use of clinical application protocol driven method for image reconstruction and display as well as image analysis. More specifically, with the scalable multislice imaging system, multiple rows (>2) of x-ray scan data along the patient's long axis are simultaneously acquired. Multiple protocols are 'pre-built' based on specific applications to determine image slice thickness, image reconstruction filter, display method, e.g., field of view, filming requirement and image archiving requirement, prospectively. Multiple image sets with different slice thickness, different reconstruction methods, different display model--axial, 3D or reformat which are pre-determined by the protocol used can then be displayed.


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