The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2000

Filed:

Aug. 04, 1999
Applicant:
Inventors:

Masakazu Yamagata, Saitama, JP;

Shunichiro Wakamiya, Saitama, JP;

Tatsuo Gotoh, Tokyo, JP;

Homu Takayama, Saitama, JP;

Yoichi Kojima, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359365 ; 359353 ; 359357 ;
Abstract

An optical axis correcting system includes a first afocal optical system, an optical deflector which corrects the deviation of an optical axis of light incident upon the first optical system, a second afocal optical system, and a light convergent optical system. The optical axis correcting system satisfies (1) 3.60<.vertline.fp(I)/fN(I).vertline.<5.30, (2) 1.00<.vertline.fp(II)/fN(II).vertline.<2.41, and (3) 0.12 <r1 (II)/f<0.23, wherein fp(I) represents the focal length of a positive lens group of the first optical system, fN(I) represents the focal length of a single negative lens element of the first optical system, fp(II) represents the focal length of a positive lens group of the second optical system, fN(II) represents the focal length of a negative lens group of the second optical system, r1(II) represents the radius of curvature of the surface oif a positive lens element of the second afocal optical system closest to the optical deflector, and f represents the focal length of the whole optical system.


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