The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2000

Filed:

Sep. 25, 1998
Applicant:
Inventors:

Susumu Machida, Tokyo, JP;

Shudong Jiang, Tokyo, JP;

Jun Chen, Tokyo, JP;

Yoshihisa Yamamoto, Stanford, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F / ;
U.S. Cl.
CPC ...
359279 ;
Abstract

An optical phase characteristic measuring apparatus includes a harmonic generator for generating a harmonic wave from a fundamental wave of output light from a light source; a beam splitter for splitting a fundamental-wave component of the output light and a harmonic component; a sample disposed in one of optical paths along which light beams from the beam splitter propagate; a unit that is composed of a signal generator and a mirror and is adapted to modulate the length of one of the optical paths; an optical mixer for mixing the light beams containing the fundamental-wave component and the harmonic component; an optical separator for separating light output from the optical mixer into a fundamental-wave component and a harmonic component; a first optical detector for detecting a fundamental-wave component of an output from the optical separator; a second optical detector for detecting a harmonic component of the output from the optical separator; and a phase detector for detecting the phase difference between AC signals output from the two optical detectors. An optical amplitude/phase characteristic measuring apparatus has a similar structure but includes two light sources, a sum-frequency generator, and other related circuits.


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Machida, Susumu. (2000). Apparatus and method for measuring characteristics of light (U.S. Patent No. 6141138). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6141138

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