The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2000

Filed:

Jan. 23, 1998
Applicant:
Inventors:

Antoine Echeyde Cubillo, Doraville, GA (US);

Ning Lu, Mountain View, CA (US);

Assignee:

Iterated Systems, Inc., Atlanta, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
345439 ; 345473 ; 382248 ;
Abstract

A method and apparatus are described for providing a scaled expanded image array of an original image array representing a physical entity, such as an image or sequence of frames, by utilizing fractal transform methods. The method of the invention includes steps performed by a data processor. Fractal transform methods are used to select a best domain/range block correspondence in an original image array. The range block is larger than the domain block. A subset of the data values in the range block is selected. Finally, an area of the expanded image array is populated with the data values in the selected subset where the area corresponds to the domain block location in the original image array.


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