The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2000

Filed:

Dec. 28, 1998
Applicant:
Inventors:

Martin John Andrusiak, St. Paul, MN (US);

Scott Jo Benjamin, Lakeville, MN (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342185 ; 342195 ;
Abstract

A process provides radar scan conversion from radar amplitude data in polar coordinates to rectangular coordinates by a digital computer which receives (r,.theta.) coordinate amplitude data from a radar receiver and which supplies (x,y) coordinate amplitude data which covers a rectangular-shaped display area of a monitor display. A software program generates an aggregate radial scan pattern that consists of a plurality of radials each of which have active lengths that span one or more of a plurality of selected regions of the display such that the region boundaries are square as a result of a modified radial drawing method. Each resolution region is defined by the bisection of the radials forming the previous resolution region and the hole-filled range of the previous resolution region. The display can be generated as an offset display where the antenna center may be offset from the display center.


Find Patent Forward Citations

Andrusiak, Martin. (2000). Ruler algorithm for ppi rectangular radar scan converter with staircase (U.S. Patent No. 6140955). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6140955

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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