The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2000
Filed:
Oct. 01, 1998
Takaiki Nomura, Osaka, JP;
Kazufumi Ogawa, Nara, JP;
Jun Oe, Hyogo, JP;
Tadashi Ohtake, Osaka, JP;
Tohru Nakagawa, Shiga, JP;
Toshimitsu Kurumizawa, Osaka, JP;
Shuzou Tokumitsu, Hyogo, JP;
Tsuneo Shibata, Hyogo, JP;
Hidekata Kawanishi, Osaka, JP;
Satoshi Shimizu, Osaka, JP;
Mamoru Isogai, Nara, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
This invention provides a contamination-resistant float glass showing even quality in durability and its good quality sufficienty. The film for contamination-resistance is formed only on the top-side surface of a float glass. The surface, free from tin diffused from a float bath, can be identified by ultraviolet irradiation. A solution including a chemical adsorbent like fluoroalkyltrichlorosilane is applied to the top-side surface by a roller coater. The adsorbent can be prevented from hydrolyzing with dry air around the coating portion of the coater. Surplus solution can be removed with dry air blown on the surface to make the contamination-resistant property and the appearance better. The chemical adsorbent is bonded to the surface via a siloxane bond to form a thin film. The contamination-resistant float glass is installed in the front door of an apparatus like a toaster oven with the film facing the inside of the oven. The film on the top-side surface shows higher contact angles than that on the bottom-side surface in durability tests.