The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2000

Filed:

Jul. 28, 1998
Applicant:
Inventors:

Detlef Pauluth, Ober-Ramstadt, DE;

Joachim Krause, Dieburg, DE;

Gunter Gauglitz, Tubingen, DE;

Bernd Drapp, Reutlingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356361 ; 356345 ;
Abstract

Optical transducers for measuring a contaminant in a gas are disclosed, whereby said contaminant interacts with a liquid crystalline phase as a sensing element in a flow cell. According to the invention nematic crystalline phases on a orientation layer are used. Means are provided to measure or to detect changes of the refractive index of said liquid crystalline phase caused by interaction of said contaminant with said liquid crystalline phase. In preferred embodiments the means for measuring or for detecting the refractive index is a Mach-Zehnder interferometer, a grating coupler, or a device for e.g. visual detection, whereby the flow cell is placed between two linearly polarizing filters, and whereby the two axis of polarization are crossed. Furthermore optical transducers are disclosed, which contain an isotropic dopant in a liquid crystalline phase. Also disclosed is the use of these optical transducers for detecting or measuring contaminants in gases using an optical transducer according to the invention.


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