The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2000
Filed:
Nov. 23, 1998
Alan J Polito, Danville, CA (US);
Richard M Thayer, Alamo, CA (US);
Robert K DiNello, Hayward, CA (US);
George H Sierra, Concord, CA (US);
Dennis Nixon, Merrimack, NH (US);
Alan Phillips, Los Altos, CA (US);
Stuart Neubarth, Mountain View, CA (US);
PraxSys BioSystems, Inc., San Ramon, CA (US);
Abstract
An embodiment of the present invention provides a method for performing a lateral flow assay. The method includes depositing a sample on a test strip at an application region, detecting a first detection signal arising from the test strip in the first detection zone, and generating a baseline for the first measurement zone by interpolating between values of the detection signal outside of the first measurement zone and inside of the first detection zone. The method may include locating a beginning boundary and an ending boundary for the first measurement zone on the test strip. Additional detection zones having measurement zones may also be incorporated with the embodiment.