The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2000

Filed:

Dec. 01, 1998
Applicant:
Inventors:

Gregory R Bashford, Menomonee Falls, WI (US);

Edward D Nonnweiler, Milwaukee, WI (US);

David D Becker, Milwaukee, WI (US);

David John Muzilla, Mukwonago, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600447 ;
Abstract

An ultrasound imaging system having an adaptive spatial filter the filter coefficients of which, for particular image parameter sample, are determined by counting the number of neighboring image parameter samples having zero or near-zero values. If the number of zero or near-zero values in a data window is greater than a predetermined threshold, the data in the window is passed, not filtered. This filter has two advantages over other spatial filters. First, image parameter data samples having only zero or near-zero neighboring values (i.e., isolated 'point noise') are not smeared. Second, boundaries such as the edge of color in a vessel (where the surrounding area is black, i.e., the color image parameter values are zero or near zero) are not smoothed as much as in conventional filters, preserving the sharpness of the edge.


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