The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2000

Filed:

Jan. 19, 1999
Applicant:
Inventor:

Makoto Yoshida, Gamagori, JP;

Assignee:

Nidek Co., Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351200 ;
Abstract

An ophthalmic apparatus including a measuring part for examining or measuring an eye to be examined by bringing the measuring part into predetermined alignment condition relative to the eye, the apparatus comprising a target projecting device for projecting a plurality of alignment targets on a cornea of the eye with predetermined arrangement therebetween, a luminance point detecting device for detecting luminance points of which intensity is equal to, or brighter than a predetermined intensity level from luminance points formed on the cornea of the eye upon projecting the alignment targets thereon by the target projecting device, an irregular luminance point detecting device for detecting irregular luminance points based on information about the luminance points detected by the luminance point detecting device and a movement instructing device for instructing movements of the measuring part relative to the eye based on the information about the luminance points from which the irregular luminance points detected by the irregular luminance point detecting device are excluded.


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