The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2000
Filed:
Dec. 21, 1998
Gabriel E Pettner, Orange, CT (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
The present invention relates to a method and system for accurately measuring mail piece thickness for the purpose of determining postage discount qualification of a mail piece to be placed in a mail tray for receiving the maximum postage discount. The system includes a device for measuring the thickness of said mail piece and a user interface for entering data representing at least one postal address and the measured mail piece thickness. The system further includes a data processing system for processing the mail piece in accordance with the set of address data and the mail piece thickness, to produce a set of mail piece data. The data processing system is coupled to the thickness measuring device and the user interface and includes a memory for storing the sets of data. The system further sorts the sets of mail piece database upon postal guidelines such that qualification of a mail piece can be determined. Output is provided for displaying the resulting mail piece identifier.