The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2000
Filed:
Mar. 16, 1998
John D Spano, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method for partial parallel testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets. Each socket is used for testing an integrated circuit package. A first one of the sockets has a full complement of signal channels, and the other sockets have exclusive subsets of the full complement of signal channels. The first socket and the other sockets support parallel testing of the integrated circuit packages according to a first type of test. Only the first socket, with its full complement of signal channels, supports a second type of test. To test a plurality of integrated circuit packages, a group of packages are inserted in the sockets. A first-pass test is then performed, in parallel, on the packages in the sockets. Then, for packages that passed the first-pass test, second-pass testing is performed sequentially using the first socket.