The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2000
Filed:
Jan. 23, 1998
Applicant:
Inventors:
Gousheng Tan, Waukesha, WI (US);
Matthew A Bernstein, Waukesha, WI (US);
Steven M Metcalfe, Delafiend, WI (US);
Assignee:
General Electric Company, Milwaukee, WI (US);
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600410 ; 324309 ;
Abstract
A fast spin echo (FSE) pulse sequence is employed to perform a multi-slice, multi-angle MRI scan. The slices are scanned in groups, with all the slices in each group being oriented at the same angle and sampled in an interleaved manner. Total scan time is reduced by acquiring multiple, separately phase encoded echo signals during each FSE pulse sequence. Presaturation bands may be produced for each group of slices to reduce flow artifacts in the reconstructed slice images.