The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2000
Filed:
Dec. 09, 1998
Yong-Sheng Chao, Storrs, CT (US);
Advanced Optical Technologies, Inc., E. Hartford, CT (US);
Abstract
An apparatus and method for removing scatter from x-ray images acquired by two-dimensional digital detectors. The apparatus consists of, in physical order, an x-ray source, a front two-dimensional x-ray detector, a beam selector, and a rear two-dimensional x-ray detector. The subject is located between the x-ray source and front detector. There two types of beam selectors, one allowing only primary x-rays to reach selected locations of the rear detector, and the other allowing primary x-rays and scatter to reach selected locations of the rear detector while allowing only scatter x-rays to reach shadowed locations of the rear detector. The method includes determining a low-resolution primary x-ray rear detector image, calculating an approximate low-resolution primary x-ray front detector image, calculating a high-resolution primary image at the front detector, and applying one or more of several correction procedures for achieving higher accuracy from the approximations.