The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2000
Filed:
May. 01, 1998
Fumio Kubota, Nishinomiya, JP;
Sysmex Corporation, Hyogo, JP;
Abstract
A particle measuring apparatus includes a characteristic parameter extracting device for extracting a plurality of characteristic parameters from each particle in a sample, and a distribution diagram preparing device for preparing a first distribution diagram on the basis of the extracted characteristic parameters. It further includes a first separating device for separating a cluster including target particles from others on the prepared first distribution diagram. In addition, a discriminating device is included for setting a specified discrimination standard for the separated cluster including the target particles and for judging whether the particles in the cluster are target particles or non-target particles on the basis of the discrimination standard. Finally, a counting device is included for counting the number of the target particles on the basis of a discrimination result of the discriminating device.