The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2000

Filed:

Jan. 28, 1999
Applicant:
Inventors:

Tomohiro Tanaka, Kanagawa, JP;

Hisashi Yoshida, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ; G04F / ;
U.S. Cl.
CPC ...
356-507 ; 356-508 ; 368118 ; 368120 ;
Abstract

A distance measurement apparatus for measuring distance to the target by measuring a time elapsed from the emission of pulsed light to the target until the receiving thereof. This apparatus comprising a light-emitting section, a light-receiving section, a delay circuit for delaying at least one of generation of the trigger signal with respect to a measurement start signal and the outputting of the measurement stop signal with respect to the reflected pulsed light and outputting thus delayed signal, a reference clock section, time measuring sections consisting of a start-side and stop-side fractional time signal measurement sections and a counter section, and a distance measurement section for determining, based thus measured items, the distance to the target according to the time from the emission of the pulsed light to the receiving thereof.


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Tanaka, Tomohiro. (2000). Distance measurement apparatus (U.S. Patent No. 6133992). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6133992

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