The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2000

Filed:

Dec. 15, 1998
Applicant:
Inventors:

Kyeong-Nam Lee, Kyungki-do, KR;

Woon-Yong Park, Kyungki-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F / ;
U.S. Cl.
CPC ...
349141 ;
Abstract

A gate wire including a gate line, a gate electrode and a gate pad, and a common signal wire including a plurality of common electrodes and a common signal line connecting the common electrodes are formed on a substrate. A first data pattern including a first data line defining a pixel region along with the gate line, a source and drain electrode, a first data pad and a pixel wire parallel to the common electrodes is formed on a gate insulating layer covering the gate wire and the common signal wire. A second data pattern including a second data line, a second data pad and a supplementary gate pad, which are connected to the first data line, the first data pad and the gate pad respectively through contact holes formed in a passivation layer, is on the passivation layer. Here, the first or the second data line and the common electrodes adjacent thereto overlap each other to prevent the light leakage near the edges of the pixel region and to increase the aperture ratio of the LCD. The data pattern may have a double-layered structure in order to prevent its disconnections, and the short between the data pattern and the common electrodes adjacent to the second data line is reduced by disposing the gate insulating layer and the passivation layer therebetween. The upper layer of the first or the second data pad and the supplementary gate pad are made of either chromium, molybdenum, molybdenum alloy or ITO to improve the high reliability of the contact property.


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