The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2000

Filed:

Jul. 07, 1998
Applicant:
Inventor:

Pekka M Typpo, Cupertino, CA (US);

Assignee:

Impact Systems, Inc., Los Gatos, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21F / ; G21F / ;
U.S. Cl.
CPC ...
2504971 ; 2504981 ; 2505061 ; 2504961 ;
Abstract

For measuring basis weight of a moving web in the cross direction scanner of a paper-making machine, an encapsulated nuclear source of Promethium 147 is used because of its wide area of emission. To conserve space it is mounted on a vertical axis. The source in a horizontal plane parallel to the moving web from a stowed position where the source is shielded to an active position where the source emits through an aperture, through the moving web, and to a detector. The x-y array planar type detector uses four detector segments symmetrically arranged around a center and compensates for belt direction misalignment (the belt driving the cross direction scanners) by mathematically manipulating the electrical signals from each detector to eliminate the error term.


Find Patent Forward Citations

Typpo, Pekka. (2000). Nuclear gauge for measuring a characteristic of moving sheet material (U.S. Patent No. 6133578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6133578

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…