The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2000
Filed:
May. 19, 1998
Georg Mies, Wipperfurth, DE;
Klingelnberg Sohne GmbH, Huckeswagen, DE;
Abstract
A scanning head for completely measuring gears and gearlike workpieces on numerically controlled measuring instruments must also posses 3-D properties for scanning unknown contours. To that end, the scanning pin or probe must deflect of its own accord in the currently prevailing direction normal to the contour being scanned. Only those scanning heads, whose behavior is statically and dynamically the same in all arbitrary deflection directions, can do this. The new scanning head achieves this by providing, for the three spatial coordinates X, Y, Z, two leaf spring parallelograms (1, 2) attached one behind the other to the stationary scanning head base (4). The first parallelogram (1), which is pivotable about the horizontal axis, permits deflections of the scanning pin carrier (3) in the XZ plane and the second parallelogram (2) permits deflections in the Y direction. Through this decoupling, achieved by means of connecting element (15) and the double-jointed rods (26), the displaced mass can be sufficiently close to being equally great in all arbitrary deflection directions. Preferably, the new scanning head is so constructed that, if desired, a predeterminable deflection direction in the XZ plane can be imparted to the scanning pin carrier (3) by means of a rotatable device (30).