The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2000
Filed:
Oct. 23, 1997
Applicant:
Inventors:
Michael Bushnell, East Windsor, NJ (US);
Marwan A Gharaybeh, Sunnyvale, CA (US);
Vishwani D Agrawal, New Providence, NJ (US);
Assignee:
Rutgers University, Piscataway, NJ (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
716-4 ; 716-6 ; 703 13 ; 703 19 ;
Abstract
The present invention relates to a method and system for identifying tested path-delay faults in integrated circuits. A path status graph is generated to represent the detected status of simulated path-delay faults. The path status graph includes vertices representing primary inputs, primary outputs and elements of the circuit. Detected status path-delay faults can be dynamically distributed to edges of the path status graph. Tested path-delay faults can be identified from traversal of the edges of the path status graph.