The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2000

Filed:

Apr. 28, 1999
Applicant:
Inventor:

Hideyuki Takaoka, Hachioji, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359370 ; 359381 ; 359370 ; 359371 ; 359385 ; 359386 ; 359821 ;
Abstract

For observing transparent phase objects and the like, an optical microscope is provided with an aperture element 13 and an optical modulation element 14 that creates an image having the detecting sensitivity of the phase contrast imaging technique while simultaneously realizing an image having the three-dimensional sense provided by the modulation contrast imaging technique. In the present invention, the aperture is shaped as an angular segment of a circular ring that is centered on the optical axis and the corresponding optical modulation element includes either a light attenuating phase plate in the shape of a circular ring, or a light attenuating region in the shape of a circular ring with all other regions of the optical modulation element adding a phase retardation to the light passing therethrough.


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