The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2000
Filed:
Nov. 30, 1998
Applicant:
Inventor:
Masatoshi Kato, Kofu-shi, Yamanashi-ken, JP;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324761 ; 324754 ; 324755 ; 324758 ;
Abstract
An apparatus for testing integrity of a printed circuit board is provided which employs a probe with moveable and/or fixed needle portions at its ends and a flange, probe retention boards having apertures for sliding the probe through, an interface board disposed parallel to the probe retention boards. The flange is disposed between the retention boards and the interface board. The needle portion provided away from the interface board comes in contact with the printed circuit board for testing. No socket is used in the apertures for accommodating the probe in the apertures. An assembly kit including these parts are provided for assembly by a user.