The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2000

Filed:

Sep. 23, 1999
Applicant:
Inventors:

Shunichi Oohara, Ibaraki-ken, JP;

Taichiro Yamashita, Tsuchiura, JP;

Naoki Sasaki, Ibaraki-ken, JP;

Masahisa Aoyagi, Ishioka, JP;

Hideo Inui, Owariasahi, JP;

Junji Fujita, Nagoya, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H / ;
U.S. Cl.
CPC ...
271262 ; 271263 ; 27126504 ;
Abstract

An overlap detection apparatus having a conveyance path for conveying letters including a letter release section where the letters are not held, a bending section formed in the letter release section, and a butt into which the forward end of the letters released from the conveyance path in the bending section is brought into contact. A detector is provided for detecting the forward end of a letter on the butt and an overlap judging arrangement for judging an overlap of letters based on the result of detection by the detector. The detector includes a light source for projecting light on the surface of a letter and a line sensor having a plurality of light receiving elements arranged in a line, wherein the line sensor detects a shadow of the forward end of the letters cast by the light source.


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