The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2000
Filed:
May. 19, 1999
Yaohui Zhang, Katy, TX (US);
PGS Seres AS, Lysaker, NO;
Abstract
A method and device for processing a seismic survey data set including: an actual source location, an actual receiver location, and an actual reflection event location is provided. The actual source location and actual receiver location are over a first layer having a first layer velocity and a first layer ray parameter, and over a second layer having a second layer velocity different from the first layer velocity and a second layer ray parameter different from the first layer ray parameter. The actual reflection event location is located below the first layer. The method comprises: providing the first layer velocity; providing the second layer velocity; providing the first layer ray parameter; providing the second layer ray parameter; determining a correction factor for the position of a ray path end dependant upon the first and second layer velocities and the first and second layer ray parameters; and applying the correction factor to the ray path end, wherein a ray path-corrected ray path end is provided. The ray path end comprises a member of the group consisting of: the actual source location, the actual receiver location, and the actual reflection event location. The ray path corrected ray path end comprises a member of the group consisting of: the ray path corrected source location, the ray path corrected receiver location, and the ray path corrected reflection event location.