The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2000
Filed:
May. 12, 1997
Tatsuro Otaki, Tokyo, JP;
Toshiaki Nihoshi, Yokohama, JP;
Manabu Sato, Yokosuka, JP;
Hitoshi Kaizu, Yokohama, JP;
Yumiko Ouchi, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A microscope system for observing an image of a sample at desired magnifications includes a first objective lens having an objective side surface which is telecentric, a focusing lens, disposed in an optical path along which optical rays emitted from the first objective lens travel, for focusing the optical rays and forming a sample image and a second objective lens having a magnification factor different from that of the first objective lens. An interchanging member holds the first objective lens and the second objective lens and is used for placing one of the first and second objective lenses in an observational optical path between the sample and the focusing lens. The inequality 0.29<D/fI<0.40 is satisfied, assuming D to be a parfocal length which equals a distance between a surface of the sample and an attachment plane of the objective lens and fI to be a focal length of the focusing lens.