The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2000
Filed:
Dec. 18, 1996
Applicant:
Inventors:
Judson F Parker, Round Rock, TX (US);
Lee B Metrick, Austin, TX (US);
John T Morris, Round Rock, TX (US);
Assignee:
Schlumberger Technology Corporation, , TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
358-12 ; 358-13 ; 358-19 ; 347 19 ; 364422 ; 367 25 ;
Abstract
A method, system and apparatus for calibrating the longitudinal accuracy of marking devices by using a comparison of a pattern printed on the transverse scale to a pattern printed on the longitudinal scale to calibrate the longitudinal scale is disclosed. The marking device could be a strip chart recorder, a printer, a well log printer or any other marking device for which one scale is less subject to variations or error than another. The information used for the calibration may be retained for re-use.