The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2000
Filed:
Jul. 13, 1999
Daniel Levesque, Terrebonne, CA;
Alain Blouin, Montreal, CA;
Christian Neron, Boucherville, CA;
Jean-Pierre Monchalin, Montreal, CA;
National Research Council of Canada, Ottawa, CA;
Abstract
A method and system is provided for enhanced ultrasonic detection and imaging of small defects inside or at the surface of an object. The Synthetic Aperture Focusing Technique (SAFT) has been used to improve the detectability and to enhance images in conventional ultrasonics and this method has recently been adapted to laser-ultrasonics. In the present invention, an improved version of the frequency-domain SAFT (F-SAFT) based on the angular spectrum approach is described. The method proposed includes temporal deconvolution of the waveform data to enhance both axial and lateral resolutions, control of the aperture and of the frequency bandwidth to improve signal-to-noise ratio, as well as spatial interpolation of the subsurface images. All the above operations are well adapted to the frequency domain calculations and embedded in the F-SAFT data processing. The aperture control and the spatial interpolation allow also a reduction of sampling requirements to further decrease both inspection and processing times. This method is of particular interest when ultrasound is generated by a laser and detected by either a contact ultrasonic transducer or a laser interferometer.