The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2000
Filed:
Jul. 29, 1999
Gary L Cloud, East Lansing, MI (US);
Board of Trustees Operating Michigan State University, East Lansing, MI (US);
Abstract
A speckle interferometer for measuring displacement deformation, motion or strain of an optically irregular surface of a specimen is disclosed. The interferometer includes laser, a spatial filter for receiving radiation from the laser and converting it into a spherical beam and projecting it to the optically irregular surface of the specimen is located. A reference plate located in or near the second location for reflecting or scattering some or all the radiation to a fourth location, said reflection interfering with the reflection from the optically irregular surface to form a pattern of speckles. A camera and imaging system for measuring displacement and changes in intensity of the speckles is also included.