The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2000
Filed:
Jun. 06, 1997
Gary R Janik, Palo Alto, CA (US);
Douglas W Shepard, Santa Barbara, CA (US);
Steven P Trainoff, Carpinteria, CA (US);
David T Phillips, Santa Barbara, CA (US);
Wyatt Technology Corporation, Santa Barbara, CA (US);
Abstract
A method and apparatus is disclosed for measuring the refractive index difference between a reference and sample liquid based on an interferometric design. The resultant device has an almost unlimited range of operation in contrast to a conventional interferometric refractometer of the so-called polarization type whose dynamic range is restricted to a relatively narrow range of refractive indices. The measurement of the refractive index difference between a sample and reference cell is achieved by measuring the angle through which the plane of polarization of a combined beam has rotated. For the conventional device, this angle is restricted to about .pi. radians which corresponds to a half wavelength shift between the reference and sample components of said combined beam. The extended range device disclosed permits this angle to be tracked and measured accurately over many rotations. The rotation tracking is achieved by one of three embodiments, the preferred of which involves the use of a liquid crystal retarder. The other two techniques incorporate, respectively, a rotating polarizer and a doubly split beam. All three embodiments permit the measurement of both the sine and cosine of the rotation angle and, thereby, allows a four quadrant arctangent calculation to yield the rotation angle directly. The error associated with such measurements is not a function of the rotation angle of the combined beams.